| | High Throughput Testing - Wafers | | USEA provides high throughput probing of die on wafers before and after saw. USEA's wafer mapping and
sorting services leverage our: | | | Handlers, Probers,
and Testers -
State of the art test equipment located in our San Jose, CA and LISP 1, Cabuyao City, Philippines facilities. | | High-PAS™ Testing After Saw - Proprietary technology for highly parallel
probing of wafers after saw at multiple temperatures (-55 to 200°C). | | Unique Specialty Testing - High throughput specialty testing including
UIL/UIS (avalanche), RC/CG, QG, and DC testing through our QM-1000 tester. | | Test Data in Real Time - Test data are uploaded in real time
to the cloud to enable our customers to monitor their test data in real time through our DataCruncher tool. | | WIP Tracking - State of the art online tracking of work orders through the
BEST-WIP tool. | | | | |
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